3D Surface Measuring Technology High precision analysis solution
Introduction of the product:
I-View Series measures surface information of the object in high speed and precision with the white light interference measuring technology.
The advantage of nano-resolution on the height secures accurate measurement of the height.
Non-contact 3-dimensional measuring method (white light interference measuring method) can acquire surface information of the object with rapid, accurate, and simple way.
High precision, repeatability, and reproducibility allow wide applications in laboratories, production lines, quality control teams for semi-conductor, display, precision machining areas.
Features:
1. Measurement of the height and difference in nanometer
2. High speed and precision surface shape measurement
3. Applications in various industries of transparent/transluscent products
4. Easy and simple measurement without non-destruction and pre-treatment processes
5. Excellent repeatability and reproducibility
Functions:
1. Measurement of the height, difference, angle, and shape
2. Measurement of surface roughness and wave form
3. Measurement of scratches, wear and defects
4. Measurement of the volume and cross section
5. 2-dimensional measurement (line, circle, arc, angle, width, and distance)
Applications:
1. Semi-conductor: PCB pattern (circuit, via hole), wafer surface, bump, IC pattern
2. Display : OLED film, LCE ITO/Column Space, BLU Dot, prism
3. Precision machining: cmp process, high speed machining surface
4. Patch panel: ITO, Silver pattern
5. Glass / film : defect, scratch, dent
6. LED : PSS process
Software
Measurement and analysis software provided is simple and easy to use. Use of CUDA allows fast data processing speed and accurate data output (2- and 3-dimension). It produces various format output required by the industry. Various analysis tools have been developed for the desired results and analysis, being now widely used in various applications.
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