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<title><![CDATA[EC21 Product Catalogs - semiconductor process]]></title>
<link><![CDATA[https://www.ec21.com/ec-market/semiconductor-process--2721/1/semiconductor process.html]]></link><item>
<title><![CDATA[WINNER803 Double Laser Dynamic Light Scattering Nano Particle Size Analyzer]]></title><link><![CDATA[https://winnerparticlesize.en.ec21.com/WINNER803-Double-Laser-Dynamic-Light--12070392_12070397.html]]></link><description><![CDATA[Semiconductor temperature control technology, precision control within ±0.1℃，make samples be in a constant state throughout the testing process, prevent testing error because temperature change ]]></description><pubDate><![CDATA[20260421]]></pubDate></item>
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<title><![CDATA[Winner 2018 Intelligent Laser Particle Size Analyzer]]></title><link><![CDATA[https://winnerparticle.en.ec21.com/Winner-2018-Intelligent-Laser-Particle--11683753_11683805.html]]></link><description><![CDATA[Semiconductor
Laser (λ= 635nm, P&gt;2MW)
Lifetime&gt;25000hour
Dispersion
Method
Ultrasonic
Frequency:40KHz Power:60W, Time: ≥1S 
Stir
Revolutions Speed: 0-3000RPM (Adjustable)
Circulate
Rated Flow:8L/m]]></description><pubDate><![CDATA[20221130]]></pubDate></item>
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<title><![CDATA[0.01-800 Wet Laser Particle Size Analyzer]]></title><link><![CDATA[https://jiahang1.en.ec21.com/0.01-800-Wet-Laser-Particle--11600339_11853670.html]]></link><description><![CDATA[process automatic laser particle size analyzer, which adopts the most advanced international Mie scattering principle and convergent light Fourier transform optical path. High-density probes and full]]></description><pubDate><![CDATA[20231012]]></pubDate></item>

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