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<title><![CDATA[EC21 Product Catalogs - national semiconductor]]></title>
<link><![CDATA[https://www.ec21.com/ec-market/national_semiconductor--2721/1/national semiconductor.html]]></link><item>
<title><![CDATA[WINNER2006B Intelligent Wet Laser Particle Size Analyzer]]></title><link><![CDATA[https://winnerparticlesize.en.ec21.com/WINNER2006B_Intelligent_Wet_Laser_Particle--12069738_12071633.html]]></link><description><![CDATA[national standard sample)
Laser parameters
Main laser source: high-performance laser λ= 632nm, power P&gt;2mw
Auxiliary laser source: semiconductor laser λ=405nm, power P&gt;2mW
none
Dispersion method
Ul]]></description><pubDate><![CDATA[20260509]]></pubDate></item>
<item>
<title><![CDATA[Winner 2009 Wet Large-range Laser Particle Size Analyzer Particle Size Analyzer]]></title><link><![CDATA[https://winnerparticle.en.ec21.com/Winner_2009_Wet_Large_range--11886702_11886705.html]]></link><description><![CDATA[national level.
(3) The particle size analyzer adopts a fully automatic built-in wet dispersion system
The instrument is reasonably integrated with ultrasonic dispersion, mechanical stirring and circ]]></description><pubDate><![CDATA[20240111]]></pubDate></item>
<item>
<title><![CDATA[0.01-800 Wet Laser Particle Size Analyzer]]></title><link><![CDATA[https://jiahang1.en.ec21.com/0.01_800_Wet_Laser_Particle--11600339_11853670.html]]></link><description><![CDATA[national Mie scattering principle and convergent light Fourier transform optical path. High-density probes and full-scale seamless connection test methods ensure the accuracy and repeatability of tes]]></description><pubDate><![CDATA[20231012]]></pubDate></item>

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