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<title><![CDATA[EC21 Product Catalogs - semiconductor process systems]]></title>
<link><![CDATA[https://www.ec21.com/ec-market/semiconductor_process_systems--2721/1/semiconductor process systems.html]]></link><item>
<title><![CDATA[Winner2309C Fully Automatic Wet and Dry Laser Particle Size Analyzer]]></title><link><![CDATA[https://winnerparticlesize.en.ec21.com/Winner2309C_Fully_Automatic_Wet_and--12069898_12072185.html]]></link><description><![CDATA[system, so that the scattered light is not limited by the lens aperture. The dual laser orthogonal light is assisted by a semiconductor laser to expand the scattering angle from 45 degrees to 135 deg]]></description><pubDate><![CDATA[20260519]]></pubDate></item>
<item>
<title><![CDATA[WINNER3003 Dry Dispersion Laser Particle Size Analyzer]]></title><link><![CDATA[https://winnerparticle.en.ec21.com/WINNER3003_Dry_Dispersion_Laser_Particle--11683753_11683861.html]]></link><description><![CDATA[Semiconductor laser (λ= 632.8nm
, P
&gt;2.0MW)
Dispersion Method
Dry-turbulence dispersion mode
Operation Mode
Manual / one key test
Optical 
Path
Calibration System
manual
Dispersing Medium
Compressed]]></description><pubDate><![CDATA[20221130]]></pubDate></item>
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<title><![CDATA[0.01-800 Wet Laser Particle Size Analyzer]]></title><link><![CDATA[https://jiahang1.en.ec21.com/0.01_800_Wet_Laser_Particle--11600339_11853670.html]]></link><description><![CDATA[process of JH5100-H0.01-800 Wet Laser Particle Size Analyzeris all automatically controlled by the computer. The schematic diagram of the control system is as follows:
Main performance characteristic]]></description><pubDate><![CDATA[20231012]]></pubDate></item>

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