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<title><![CDATA[EC21 Product Catalogs - laboratory oven]]></title>
<link><![CDATA[https://www.ec21.com/ec-market/laboratory-oven--2717/1/laboratory oven.html]]></link><item>
<title><![CDATA[Hot Air Laboratory Large High Temperature Oven]]></title><link><![CDATA[https://cn03892846.en.ec21.com/Hot-Air-Laboratory-Large-High--11547934_11547936.html]]></link><description><![CDATA[temperature range:R.T+10℃~300℃
Temperature fluctuation:≤±0.5℃ (no-load)
Temperature deviation:≤±1℃ (no-load)
time to Max.temperature:Approx.60min (R.T+10℃~300℃)
Control System:PID
D]]></description><pubDate><![CDATA[20220329]]></pubDate></item>
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<title><![CDATA[Test &amp; Measurement, SMT &amp; General Electronic Assembly Equipment]]></title><link><![CDATA[https://ergodove.en.ec21.com/Test-Measurement--9526901_11859510.html]]></link><description><![CDATA[* Four different event close on different date
* Agilent Oscilloscope, Tektronix Logic Analyzer, Nitrogen Lead-free Reflow Oven and more
* Schaffner Bilog Antenna, ETS-Lingren 3117, Agilent Keysight ]]></description><pubDate><![CDATA[20231027]]></pubDate></item>
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<title><![CDATA[Stability Chamber Walk in Temperature and Humidity Testing]]></title><link><![CDATA[https://alibiota1431.en.ec21.com/Stability-Chamber-Walk-in-Temperature--11847973_11847978.html]]></link><description><![CDATA[Application
JOEO is China&apos;s walk in stability test chamber,solar radiation test chamber, room oven, walk in stability chamber manufacturer,JOEO humidity stability chamber with advanced control system]]></description><pubDate><![CDATA[20231107]]></pubDate></item>
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<title><![CDATA[STHX-A Digital Display Constant Temperature Convection Drying Oven]]></title><link><![CDATA[https://hzyueke003.en.ec21.com/STHX-A-Digital-Display-Constant--6176826_6180068.html]]></link><description><![CDATA[STHX-A Digital Display Constant Temperature Convection Drying Oven
Application:Widely used in industrial and mining enterprises, laboratories and scientific research department.
Specification:
1. Tem]]></description><pubDate><![CDATA[20150827]]></pubDate></item>

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