EC21 Product Catalogs - semiconductor test interface

GS-SW3201730300-C1-CL Cooled SWIR Camera

20240530

test image, information saved, cross indication. Electrical interface HR10 D igital interface Mini Camera Link A nalog interface SMA External trigger port RS422 Control interface RS422 L ens m

Sobek Metallographic Tool-Makers Microscope

20180228

interface support, the latest DP - E1 data processor or SC counter and SBK-MAX data processing software, *The MC300/400 can provide you with excellent geometric data processing & storage capacity.

Borderline Pumping Temperature of Engine Oil Tester

20231020

interface; 10. The program automatically controls temperature by nonlinear curve, and measures yield stress and apparent viscosity; 11. The temperature control curve can be edited and drawn in real

AS-2011 Micron Laser Particle Size Analyzer 0.1-500um

20100926

Semiconductor laser (635nm, 3mw, 25000hrs) Scanning speed: 2000/sec Test time:< 1 minute, sample preparation not counted Power supply:AC 220V±10% 50Hz or 60Hz,Power 80W Computer interface:stan

Ponovo PW636i Protection Relay Test System for Different Types of Protection Relays

20230609

test*Current booster interface for testing high burden relay*Support importing setting value of relays via XRIO/RIO/PONOVO's Powertest default set files automatically In‐Built Analog Monitoring & R