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<title><![CDATA[EC21 Product Catalogs - semiconductor test]]></title>
<link><![CDATA[https://www.ec21.com/ec-market/semiconductor_test--2717/1/semiconductor test.html]]></link><item>
<title><![CDATA[ST-6601 Insulation &amp; Continuity Tester]]></title><link><![CDATA[https://satatec.en.ec21.com/ST_6601_Insulation_Continuity_Tester--7687564_7687932.html]]></link><description><![CDATA[test result for difference sound and light;
Can be used for test the resistance of mini-type transformer, the reverse creepage and insulation resistance of small capacitor and the semiconductor LED.
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<title><![CDATA[GS-SW3201730300-C1-CL Cooled SWIR Camera]]></title><link><![CDATA[https://gatherstar.en.ec21.com/GS_SW3201730300_C1_CL_Cooled--11943440_11943843.html]]></link><description><![CDATA[Semiconductor inspection
Specifications
Model 
GS-SW3201730300-C1-CL
Detector type 
InGaAs FPA
Spectral range 
0.9μm ~ 1.7μm
Resolution 
320×256
Pixel size 
30μm
Active area 
9.6mm x 7.68mm
Quant]]></description><pubDate><![CDATA[20240530]]></pubDate></item>
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<title><![CDATA[Constant Acceleration Tester]]></title><link><![CDATA[https://cmetechnology.en.ec21.com/Constant_Acceleration_Tester--11925572_11925579.html]]></link><description><![CDATA[test is performed for the purpose of determining the effects of acceleration stress on component parts
Semiconductor devices and microelectronic devices, have the ability to operate properly during e]]></description><pubDate><![CDATA[20240416]]></pubDate></item>
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<title><![CDATA[AS-2011 Micron Laser Particle Size Analyzer 0.1-500um]]></title><link><![CDATA[https://aimsizer.en.ec21.com/AS_2011_Micron_Laser_Particle--4628668_4628669.html]]></link><description><![CDATA[Test method:Liquid
Light source:Semiconductor laser (635nm, 3mw, 25000hrs)
Scanning speed: 2000/sec
Test time:&lt; 1 minute, sample preparation not counted
Power supply:AC 220V&amp;plusmn;10% 50Hz or 60Hz,P]]></description><pubDate><![CDATA[20100926]]></pubDate></item>
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<title><![CDATA[Programmable Hast Accelerated Aging Tester for Industry]]></title><link><![CDATA[https://asliequipment.en.ec21.com/Programmable_Hast_Accelerated_Aging_Tester--11825687_11825700.html]]></link><description><![CDATA[test chambers are commonly used in the development and testing of electronic components, such as integrated circuits, printed circuit boards, and semiconductor devices. They are also used in other in]]></description><pubDate><![CDATA[20230727]]></pubDate></item>
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<title><![CDATA[Ponovo PW636i Protection Relay Test System for Different Types of Protection Relays]]></title><link><![CDATA[https://xiaxiaoming.en.ec21.com/Ponovo_PW636i_Protection_Relay_Test--7403753_7404064.html]]></link><description><![CDATA[Ponovo PW636i Protection Relay Test System
Universal testing system PW636i (6x32A, 4x300V) can test all types of protectiverelays, including modern IEC61850 based relays. Other test works, such astra]]></description><pubDate><![CDATA[20230609]]></pubDate></item>
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<title><![CDATA[Thermal Shock Test Chamber(2 Zone)--Thermal Chamber Manufacturers]]></title><link><![CDATA[https://alibiota1431.en.ec21.com/Thermal_Shock_Test_Chamber_2--11847960_11863680.html]]></link><description><![CDATA[testing chamber are suitable for testing equipment for solar photovoltaic modules, batteries, automotive parts, LED optoelectronics, semiconductors, aerospace, automobiles, home appliances, scientifi]]></description><pubDate><![CDATA[20231107]]></pubDate></item>
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<title><![CDATA[Sobek Metallographic Tool-Makers Microscope]]></title><link><![CDATA[https://sobek.en.ec21.com/Sobek_Metallographic_Tool_Makers_Microscope--10029761_10670633.html]]></link><description><![CDATA[*Adopts the latest Zaxis automatic measuring system which is researched &amp; developed by the SOBEKK *With the automatic focusing system, the repeatability can reach 1.5 UM by using the most advanced op]]></description><pubDate><![CDATA[20180228]]></pubDate></item>
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<title><![CDATA[Borderline Pumping Temperature of Engine Oil Tester]]></title><link><![CDATA[https://precisionbe.en.ec21.com/Borderline_Pumping_Temperature_of_Engine--11718430_11856916.html]]></link><description><![CDATA[Instrument Introduction 
This instrument is used to measure the boundary pumping temperature, (low temperature) yield stress and apparent viscosity of motor vehicle engine oil. The test temperature c]]></description><pubDate><![CDATA[20231020]]></pubDate></item>

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