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Automated Dial Indicator Testing Machine SJ2620

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Automated Dial Indicator Testing Machine SJ2620
compared to specified standard. 9. Can query and manage the test records according to object type, manufacturer, manufacturing number, inspector, submitted institution, equipment number, inspection ...

3D Optical Surface Profilometer SuperView W1

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3D Optical Surface Profilometer SuperView W1
compared to W1.*2 Use EPSl mode to measure Sa 0.2nm silicon wafer in the laboratory environment; Single stripe, 80um filter for full field of view*3 Measure Sa 0.2nm silicon wafer in a laboratory ...

Contour Measuring Machine SJ5760

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Contour Measuring Machine SJ5760
Compare actual value with nominal value (6)The measurement program runs automatically 2. CNC Automatic mode is supported; SPC statistics and analysis are supported 3. Support to import CAD file and ...
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