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SZT-5 Four Point Probe

SZT-5 Four Point Probe
Introduction The SZT-4 silicon composite test is composed of 2 kinds of silicon material testers. 1) 2-range resistance measuring instruments are configured with hand-held four-probe detecting head ...

SZT-4 Four Point Probe

SZT-4 Four Point Probe
silicon materials must be multiplied by the detecting head correction coefficient of 0.628; the tested results of silicon material thin-thickness diffusion and conductive thin films "block ...
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