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<title><![CDATA[EC21 Product Catalogs - wafer probe...]]></title>
<link><![CDATA[https://www.ec21.com/ec-market/wafer probe....html]]></link><item>
<title><![CDATA[High-Precision  Double-headed Test Probe Used for Signal Detection in Electronic Testing Equipment]]></title><link><![CDATA[https://keyusce.en.ec21.com/High_Precision_Double_headed_Test--12062222_12063200.html]]></link><description><![CDATA[Dual-ended Test Probe &amp; POGO PIN
The double headed test probe, also known as a double ended probe, is an electrical testing tool with a contact point on both ends, used to make simultaneous electrica]]></description><pubDate><![CDATA[20251223]]></pubDate></item>
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<title><![CDATA[Factory Provide High Density Machined Fine Grain Graphite Parts Mould]]></title><link><![CDATA[https://graphiteparts666.en.ec21.com/Factory_Provide_High_Density_Machined--12044622_12044625.html]]></link><description><![CDATA[wafer etching tray, vacuum coating fixture
• New energy field: fuel cell bipolar plate, lithium battery sintering mold
• Industrial equipment: vacuum furnace heating element, mechanical seal ring]]></description><pubDate><![CDATA[20250222]]></pubDate></item>
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<title><![CDATA[Polishing Material for Micro Devices]]></title><link><![CDATA[https://neomond1.en.ec21.com/Polishing_Material_for_Micro_Devices--11943427_11943699.html]]></link><description><![CDATA[Probe pin
Pogo pin
Fine SUS pipe
Semiconductor Chip Connecter
High-density integrated circuit copper for interconnection
▶ Polishing material for miceo devices
Product
Polishing liquid
Materials us]]></description><pubDate><![CDATA[20241104]]></pubDate></item>
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<title><![CDATA[Fetal Monitor]]></title><link><![CDATA[https://yejianchun.en.ec21.com/Fetal_Monitor--1669508_2103557.html]]></link><description><![CDATA[probe with 7 wafers, combined with a special calculation method of autocorrelation of heart rates, to ensure correct and reliable measurement of fetal heart rates. 
A pressure probe with high sensiti]]></description><pubDate><![CDATA[20070727]]></pubDate></item>
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<title><![CDATA[HS PA20-Ex Multi-function Phased Array Ultrasonic Flaw Detector]]></title><link><![CDATA[https://tomn.en.ec21.com/HS_PA20_Ex_Multi_function--11322145_11322146.html]]></link><description><![CDATA[wafer in the phased selection probe with software program, consequently controlling the angle, focus placement as well as emphasis size of the created beam of light.
TOFD defect detector, TOFD certif]]></description><pubDate><![CDATA[20210113]]></pubDate></item>
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<title><![CDATA[FR4 Base LED PCB Circuit Board 1oz Copper 3/3MIL Min Line]]></title><link><![CDATA[https://electronicpcbboard.en.ec21.com/FR4_Base_LED_PCB_Circuit--11895685_11895686.html]]></link><description><![CDATA[probe cards, wafer inspection systems, etc. Capability 　High precision prototypePCB bulk productionMax Layers1-28 layers1-14 layersMIN Line width(mil)3mil4milMIN Line space(mil)3mil4milMin via (mec]]></description><pubDate><![CDATA[20240131]]></pubDate></item>

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