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Sell PQ75 Centalic Gold Plated ICT Pin with BeCu

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  • Company Name :Centalic Precision Probe (Shenzhen) Co., Ltd.
  • Membership :Free member
  • Registrarion Date :2013. 09. 17
  • CountryRegion:China
  • Address:Block C6, Xin An No. 2 Industrial Area, Gushu, Xixiang, Bao An, Shenzhen, China. Shenzhen Guangdong, China
  • Phone / Fax:86-0755-27494758  /  86-755-29122643
  • Contact:Stella Green
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PQ75 Centalic Gold Plated ICT Pin with BeCu

Product Description
In-circuit test probes are mainly used for testing the electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistance, capacitance, inductance, crystal oscillators, and perform functional tests of diode, triode, optocoupler, transformer, relay, operational amplifier, power supply module and integrated circuits.

This product is classified into PQ75. The test centers is 75 mil. Its diameter is 1.02 mm and total length is 33.02 mm. It can be fitted with receptacles such as CR, SC and WW, and complicated tip styles for example H/K/L/BK/LM.

Minimum center: 1.91 (75 mil)
Current rating: 3 amps, continuous
Contact resistance: 30 milliohms
Mounting holes size: diameter 1.35 mm
Full stroke: 6.35 mm
Rated stroke: 4.23 mm
Spring force: 198gf (7 oz)

Receptacle: brass, gold plated
Contact barrel: phosphor bronze, gold plated
Spring: music wire, gold plated
Plunger: BeCu or steel, gold plated

Company Information
Shenzhen Centalic Metal Parts Limited, established in 1992, is a wholly-owned subsidiary of our headquarters Centalic Technology Development Ltd which was founded in 1980. Specializing in R&D, manufacture, sales and technical service, Centalic is one of the earliest high-tech enterprises which concentrates on large-scale production of various test probes and precision metal parts and also the biggest domestic professional manufacturing base owning complete process devices.

Our products include semiconductor test probes, spring probes, universal complex test probes, ICT probes, wafer probes, battery contact probes, switch probes, high-current probes and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips, PCB and other electronic peripherals.

Spec minimum center: 1.91 (75 mil)
Quantity 100 pieces
Package plastic bag, plastic bottle

Product Image

  • Sell PQ75 Centalic Gold Plated ICT Pin with BeCu

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