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AWGAGE-200 Metal Film Metrology: AWgage-200 measures sheet resistance in ohms per square or milliohms per square. If specific resistivity is known, the thickness of the deposited film layer can be computed from the sheet resistance. ...

AWGAGE-150 Metal Film Metrology: AWgage-150 measures sheet resistance in ohms per square or milliohms per square. If specific resistivity is known, the thickness of the deposited film layer can be computed from the sheet resistance. ...

Upgrade Kits for Used Semiconductor Equipment: data storage.Requirement of GUI.Requirement of more precise control.Requirement of better repeatability, uniformity.Requirement of easier maintenance, calibration, and trouble shooting. Allwin21 ...

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