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Products > continuous spring > Centalic Technology Development Ltd. | Similar Products
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continuous spring

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(1-13 out of 13)

High-Current Probes Pogo Pins P420 Series for Electronic Test

High-Current Probes Pogo Pins P420 Series for Electronic Test
spring is made of gold plated music wire. The plunger is made of SK4, then gold and nickel plated. The plunger tip is made of brass, then gold and nickel plated. For details, please check parameters ...

Battery Contact Probes Test Pogo Pins BIP39 for Connector Application

Battery Contact Probes Test Pogo Pins BIP39 for Connector Application
spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold ...

Battery Contact Pogo Pins Test Probes BIP16 Series for Connector Application

Battery Contact Pogo Pins Test Probes BIP16 Series for Connector Application
spring is often made from music wire and stainless steel is an alternative. The plunger is made from beryllium copper and high carbon steel is a custom-made choice. A whole probe is plated with gold ...

Switch Probes Test Pins SWP137 Series for Connection

Switch Probes Test Pins SWP137 Series for Connection
spring is made of gold plated music wire. The plunger is made of BeCu, then gold and nickel plated. The insulating sleeve is made of POM For details of SWP137 switching probe, please check below ...

Gold Plated Switch Probes Test Pogo Pins SWP260 Series for Connection

Gold Plated Switch Probes Test Pogo Pins SWP260 Series for Connection
spring is made of gold plated music wire. The plunger is made of BeCu, then gold or nickel plated. The insulating sleeve is made of POM For details of SWP137 switching probe, please check below ...

Electronic Test Probes Pogo Pins PC50 Series for PCBA Inspection

Electronic Test Probes Pogo Pins PC50 Series for PCBA Inspection
continuous Contact Resistance 60 milliohms Mounting Hole Size Diameter 1 mm Full Stroke 6.4 mm Rated Stroke 4.3 mm Spring Force 100/110/150/200 gf (3.6/4/5.4/7.2 oz) Materials Receptacle Phosphor ...

In-circuit Test Probes Pogo Pins PQ100 Series for PCBA Inspection

In-circuit Test Probes Pogo Pins PQ100 Series for PCBA Inspection
continuous Contact Resistance 30 milliohms Mounting Hole Size Diameter 1.75 mm Full Stroke 6.35 mm Rated Stroke 4.3 mm Spring Force 100/120/156/203/255/284/312 gf (3.5/4/5.5/7.2/9/10/11 ...

In-circuit Test Probes Pogo Pins P156 Series for PCB Assembly Inspection

In-circuit Test Probes Pogo Pins P156 Series for PCB Assembly Inspection
continuous Contact Resistance 50 milliohms Mounting Hole Size Diameter 2.75 mm Full Stroke 6.35 mm Rated Stroke 4.32 mm Spring Force 113/198/255/285 gf (4/7/9/10 oz) Materials Receptacle Phosphor ...

Single-ended Probes Pogo Pins P125 Series for PCBA Test

Single-ended Probes Pogo Pins P125 Series for PCBA Test
continuous Contact Resistance 30 milliohms Mounting Hole Size Diameter 2.4 mm Full Stroke 6.35 mm Rated Stroke 4.32 mm Spring Force 113/198/255/285 gf (4/7/9/10 oz) Materials Receptacle Phosphor ...

Double-Ended Pogo Pins Test Probes SCFB029 (40) for Chip Inspection

Double-Ended Pogo Pins Test Probes SCFB029 (40) for Chip Inspection
spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips ...

Semiconductor Test Probes Double-ended Pogo Pins SCPE015 for IC Inspection

Semiconductor Test Probes Double-ended Pogo Pins SCPE015 for IC Inspection
spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips ...

Frequency Test Probes Pogo Pins SCPC078 for Chip Inspection

Frequency Test Probes Pogo Pins SCPC078 for Chip Inspection
spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips ...

Harness Probes Test Pins CHZ136 for the Tests of Automotive Industry

Harness Probes Test Pins CHZ136 for the Tests of Automotive Industry
spring inside the barrel will probably be damaged under constant pressure. When the plunger is pressed at a distance of 4.3 mm, its loaded force is about 113 gf, namely 4 ounces or so. Furthermore, ...
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