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Products > spring applied > Centalic Technology Development Ltd. | Similar Products
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(1-14 out of 14)

Interface Probes Test Pins IFP-001 Used for Transmitting Electrical Signals

Interface Probes Test Pins IFP-001 Used for Transmitting Electrical Signals
products include semiconductor test probes, in-circuit test probes, radio frequency probes, harness probes, battery contact probes, switching probes, big-current probes, spring probes, universal ...

High-Current Probes Pogo Pins P420 Series for Electronic Test

High-Current Probes Pogo Pins P420 Series for Electronic Test
applied to the in-circuit test field of high temperature and high current environments. High-current probes manufactured by Centalic mainly include P203, P264, P265, P350 and P420, etc. There is a ...

Battery Contact Probes Test Pogo Pins BIP39 for Connector Application

Battery Contact Probes Test Pogo Pins BIP39 for Connector Application
spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips ...

Battery Contact Pogo Pins Test Probes BIP16 Series for Connector Application

Battery Contact Pogo Pins Test Probes BIP16 Series for Connector Application
spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips ...

Switch Probes Test Pins SWP137 Series for Connection

Switch Probes Test Pins SWP137 Series for Connection
spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips ...

Gold Plated Switch Probes Test Pogo Pins SWP260 Series for Connection

Gold Plated Switch Probes Test Pogo Pins SWP260 Series for Connection
spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips ...

Electronic Test Probes Pogo Pins PC50 Series for PCBA Inspection

Electronic Test Probes Pogo Pins PC50 Series for PCBA Inspection
spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips ...

In-circuit Test Probes Pogo Pins PQ100 Series for PCBA Inspection

In-circuit Test Probes Pogo Pins PQ100 Series for PCBA Inspection
spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips ...

In-circuit Test Probes Pogo Pins P156 Series for PCB Assembly Inspection

In-circuit Test Probes Pogo Pins P156 Series for PCB Assembly Inspection
spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips ...

Single-ended Probes Pogo Pins P125 Series for PCBA Test

Single-ended Probes Pogo Pins P125 Series for PCBA Test
spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips ...

Double-Ended Pogo Pins Test Probes SCFB029 (40) for Chip Inspection

Double-Ended Pogo Pins Test Probes SCFB029 (40) for Chip Inspection
applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product ...

Semiconductor Test Probes Double-ended Pogo Pins SCPE015 for IC Inspection

Semiconductor Test Probes Double-ended Pogo Pins SCPE015 for IC Inspection
applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product ...

Frequency Test Probes Pogo Pins SCPC078 for Chip Inspection

Frequency Test Probes Pogo Pins SCPC078 for Chip Inspection
applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product ...

Harness Probes Test Pins CHZ136 for the Tests of Automotive Industry

Harness Probes Test Pins CHZ136 for the Tests of Automotive Industry
spring probes, universal complex test probes, wafer probes, and so on. They are widely applied to the tests of various electronic products, such as in-circuit tests of semiconductor components, chips ...
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