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GS-SW6401725-80-U Scientific Deep-cooled SWIR Camera

GS-SW6401725-80-U Scientific Deep-cooled SWIR Camera
Exposure; Manual Gain; Non-uniformity Correction; Pixels correction Image function Frame rate selection; Synchronization method selection; Grayscale threshold adjustment; Grayscale quantitative ...

GS-SW3201730300-C1-CL Cooled SWIR Camera

GS-SW3201730300-C1-CL Cooled SWIR Camera
Correction; Pixels correction Image function Frame rate selection, synchronization method selection, contrast/brightness adjustment (manual), enhancement, test image, information saved, cross ...

GS-SW3201730200-UC-CL Uncooled SWIR Camera

GS-SW3201730200-UC-CL Uncooled SWIR Camera
Gain; Nonuniformity Correction; Pixels correction Image function Frame rate selection, synchronization method selection, contrast/brightness adjustment (manual), enhancement, test image, ...

GS-SW640171550-UC-CL Uncooled SWIR Camera

GS-SW640171550-UC-CL Uncooled SWIR Camera
Gain; Nonuniformity Correction; Pixels correction Image function Frame rate selection, synchronization method selection, contrast/brightness adjustment (manual), enhancement, test image, ...

GS-SW640171550-C1-CL Cooled SWIR Camera

GS-SW640171550-C1-CL Cooled SWIR Camera
Correction; Pixels correction Image function Frame rate selection, synchronization method selection, contrast/brightness adjustment (manual), enhancement, test image, information saved, cross ...

RLK651 Handheld Infrared Emission Meter

RLK651 Handheld Infrared Emission Meter
resolution ± 0.001 Measurement accuracy ± 0.02 Display 2.42", OLED dot matrix screen, monochrome Measure time < 10 seconds (2 data acquisitions per measurement) Preheat time 90 seconds Data ...

RLK607 Contact Infrared Radiometer

RLK607 Contact Infrared Radiometer
2~30μm Measuring range 100μW/cm*cm~100mW/cm*cm (automatic range switching) Display resolution ±1.0μW Surface temperature to be measured 10℃~55℃ Surface size to be measured Bigger than Φ60mm, ...

RLK650 Portable Emission Meter

RLK650 Portable Emission Meter
Portable Emission Meter Feature Measurement principle: Directional hemispherical reflection (DHR), incidence of 20°±1°; M easuring band : Double wavelengths of light, 3~5 um um & 8 ~12; Portable ...
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