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640x512 15um SWIR InGaAs Image Sensor

640x512 15um SWIR InGaAs Image Sensor
640x512 15um SWIR InGaAs Image Sensor FEATURES Shortwave infrared (0.9μm~1.7μm,can be extended to visible light) InGaAs focal plane array detector; 640(H)×512(V) pixel array specifications; ...

GS-SW6401725-80-U Scientific Deep-cooled SWIR Camera

GS-SW6401725-80-U Scientific Deep-cooled SWIR Camera
operability >99.5% Response non - linearity <2% Cooler type TE + air cool Dark current <800e-/p/sec 25℃ Black Background Readout noise <30 e - High Gain Frame rate 20 Hz (customizable) ROI ...

GS-SW3201730300-C1-CL Cooled SWIR Camera

GS-SW3201730300-C1-CL Cooled SWIR Camera
Correction; Pixels correction Image function Frame rate selection, synchronization method selection, contrast/brightness adjustment (manual), enhancement, test image, information saved, cross ...

GS-SW3201730200-UC-CL Uncooled SWIR Camera

GS-SW3201730200-UC-CL Uncooled SWIR Camera
Gain; Nonuniformity Correction; Pixels correction Image function Frame rate selection, synchronization method selection, contrast/brightness adjustment (manual), enhancement, test image, ...

GS-SW640171550-UC-CL Uncooled SWIR Camera

GS-SW640171550-UC-CL Uncooled SWIR Camera
Gain; Nonuniformity Correction; Pixels correction Image function Frame rate selection, synchronization method selection, contrast/brightness adjustment (manual), enhancement, test image, ...

GS-SW640171550-C1-CL Cooled SWIR Camera

GS-SW640171550-C1-CL Cooled SWIR Camera
Correction; Pixels correction Image function Frame rate selection, synchronization method selection, contrast/brightness adjustment (manual), enhancement, test image, information saved, cross ...

RLK605 Infrared Radiation Power Meter

RLK605 Infrared Radiation Power Meter
RLK605 Infrared Radiation Power Meter F eatures Measuring band: 2 ~ 2 5 um ; Measurement sensitivity : 0.1W ; Aiming method : laser dot indication aiming; Operation method : Manually input the ...

RLK650 Portable Emission Meter

RLK650 Portable Emission Meter
Portable Emission Meter Feature Measurement principle: Directional hemispherical reflection (DHR), incidence of 20°±1°; M easuring band : Double wavelengths of light, 3~5 um um & 8 ~12; Portable ...
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