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Place of origin:
China
further characterizations like EBSD ( electron backscatter diffraction ),SEM Scanning Electron Microscope, Nano indentation using AFM (atomic force microscopy) or micro hardness testing. Due to the very gentle removal of material it is applicable especially for soft and ductile materials, like tianium-alumium, pure copper and copper alloys, aluminum allloys, soft steel, and Nickel-based alloys.
[Related Keywords : Polishing Machine]
Business Type
Manufacturer
Location
Jiangsu, China
Employees Total
51 - 100
Annual Revenue
USD 500,001 - 1,000,000
Competitive atomic force microscope products from various atomic force microscope manufacturers and atomic force microscope suppliers are listed above, please select quality and cheap items for you.
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