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Place of origin:
China
3), the angle of all peak in full spectrum are not more than ±0.02° Detector Proportional counters(PC)or scintillation counter(SC),Silicon dtift detector(SDD),High speed one-dimensional semiconductor array detector Maximal counting rate of linearity 5×105CPS(PC、SC with the compensate function of miss counting)、15×104CPS (SDD)、9×107CPS(one-dimensional array) Ener
[Related Keywords : XRD, X-ray Diffractometer]
Business Type
Manufacturer
Location
Liaoning, China
Employees Total
101 - 500
Annual Revenue
USD 100,000 - 500,000
Min. Order:
1 Set
Price:
US$ 20800 ~ 29500
Place of origin:
China
Supply Ability:
300 sets/per Month
378380.8, l Three dimensional-optical bench alignment system is protected by patent No.- ZL 2013 2 0835882.4. l MIE scattering principle application patent No.- ZL 2013 2 0812021.4. l Dry particle size analyzer full sealed sample cuvette application is protected by patent No.- ZL.2011 2 0267646.8. l Dual laser beam orthogonal application is protected by patent No.-ZL 2007 2 0025702.0 l Powd
[Related Keywords : particle size analyzer, test equipment, lab equipment]
Business Type
Manufacturer
Location
Shandong, China
Employees Total
51 - 100
Annual Revenue
USD 2,000,001 - 5,000,000
Competitive 3 dimensional micro products from various 3 dimensional micro manufacturers and 3 dimensional micro suppliers are listed above, please select quality and cheap items for you.
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