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  • Industrial X-ray Diffractometer Meter

    • Place of origin:  

      China

    material: * One and many phase identification of unknown sample * Quantitative analysis of the phase in the mixed sample * Crystal structure analysis ( Rietveld structure analysis) * The crystal structure change (high temperature and low temperature condition) of the abnormal condition. * Thin film sample analysis, including film, multilayer film thickness, surface roughness, charge density.

    [Related Keywords : XRD, Diffractometer]

  • Multifunctional Industrial X-ray Diffractometer

    • Place of origin:  

      China

    material: * One and many phase identification of unknown sample * Quantitative analysis of the phase in the mixed sample * Crystal structure analysis ( Rietveld structure analysis) * The crystal structure change (high temperature and low temperature condition) of the abnormal condition. * Thin film sample analysis, including film, multilayer film thickness, surface roughness, charge density.

    [Related Keywords : XRD, Diffractometer]

  • Multifunctional XRD Instrument

    • Place of origin:  

      China

    material: * One and many phase identification of unknown sample * Quantitative analysis of the phase in the mixed sample * Crystal structure analysis ( Rietveld structure analysis) * The crystal structure change (high temperature and low temperature condition) of the abnormal condition. * Thin film sample analysis, including film, multilayer film thickness, surface roughness, charge density.

    [Related Keywords : XRD, X-ray Diffractometer]

  • Multi-functional X-ray Diffractometer

    • Place of origin:  

      China

    material: * One and many phase identification of unknown sample * Quantitative analysis of the phase in the mixed sample * Crystal structure analysis ( Rietveld structure analysis) * The crystal structure change (high temperature and low temperature condition) of the abnormal condition. * Thin film sample analysis, including film, multilayer film thickness, surface roughness, charge density.

    [Related Keywords : X-ray Diffractometer, XRD]

  • Industrial Desktop X-ray Diffractometer

    • Place of origin:  

      China

    material: Cu, power:2.4kW, focus size: 1×10mm; air cooling or water cooling (flaw>2.5L/min) Goniometer: Sample level θs-θd,radius of diffraction: 150mm Scanning fashion: Continuous, stepping and Omg Angle scanning range: θs / θd dlinkage /single action: -3° -150° Minimal stepping wide: 0.0001° Angle repeatable accuracy: 0.0005° Angle locating spe

    [Related Keywords : XRD, Desktop Diffractometer]

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