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" in Other Measuring & Analysing Instruments found 6 Products from Dandong Aolong Radiative Instrument Group Co., Ltd, China

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X-ray Titanium Dioxide Analyzing Diffraction Instrument: $X-ray Titanium Dioxide Analyzing Diffraction Instrument$; one-dimensional semiconductor array detector Maximal counting rate of linearity 5×105CPS(PC､SC with the compensate function of miss counting)､15×104CPS ...

Industrial X-ray Diffractometer Meter: $Industrial X-ray Diffractometer Meter$; speed one-dimensional semiconductor array detector Maximal counting rate of linearity 5×105CPS(PC､SC with the compensate function of miss counting)､15×104CPS ...

Multifunctional Industrial X-ray Diffractometer: $Multifunctional Industrial X-ray Diffractometer$; speed one-dimensional semiconductor array detector Maximal counting rate of linearity 5×105CPS(PC､SC with the compensate function of miss counting)､15×104CPS ...

Multifunctional XRD Instrument: speed one-dimensional semiconductor array detector Maximal counting rate of linearity 5×105CPS(PC､SC with the compensate function of miss counting)､15×104CPS ...

Multi-functional X-ray Diffractometer: $Multi-functional X-ray Diffractometer$; speed one-dimensional semiconductor array detector Maximal counting rate of linearity 5×105CPS(PC､SC with the compensate function of miss counting)､15×104CPS ...

X-ray Crystal Analysis Meter: Function JF-2000 is used to inspect inner micro structure of the material, such as: single crystal direction, flaw defects inspection, qualitative analysis of material, measure the lattice ...

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X-ray Titanium Dioxide Analyzing Diffraction Instrument