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* The perfect combining with hardware and software system, satisfy with the requirement of different application field academician, scientific research.
* High precision diffraction angle measuring system, obtaining more accurate measurement results.
* High stability X-ray generator control system, and get more stable repeatable measurement precision.
* Various functional accessories meet the requirement of different testing purposes.
* Program operation, integrated structure design, easy to operate, more beautiful appearance of the instrument;
* X-ray diffractometer is a kind of universal testing instrument for revealing crystal structure and chemical information of material:
* One and many phase identification of unknown sample
* Quantitative analysis of the phase in the mixed sample
* Crystal structure analysis ( Rietveld structure analysis)
* The crystal structure change (high temperature and low temperature condition) of the abnormal condition.
* Thin film sample analysis, including film, multilayer film thickness, surface roughness, charge density.
* Analysis of micro area sample.
* Texture and stress analysis of metallic materials
| AL-2700B | |
| Rated power | 4kW | 
| Tube voltage | 10~60kV | 
| Tube current | 5~80mA | 
| X-ray tube | Metal ceramic tube Target material: Cu、Fe、Co、Cr、Mo, etc Power:2.4kW | 
| Focus size | 1×10mm or 0.4×14mm or 2×12mm | 
| Stability | ≤0.01% | 
| Goniometer structure | Sample level(θ~θ) | 
| Radius of diffraction | 225mm(or custom by request:150~285mmrange) | 
| 2θ Scanning range | ﹣6~160°(θs:﹣3~80°、θd:﹣3~80°) | 
| Scanning speed | 0.0012°~50°/min | 
| Angle locating speed | 1500°/min | 
| Scanning fashion | θs/ θd linkage /single acting; continuous, stepping and Omg | 
| Minimal stepping angle | 1/10000° | 
| Angle repeatable accuracy | 1/10000° | 
| 2θ Angular linearity | International standard sample(Si, Al203), the angle of all peak in full spectrum are not more than ±0.02° | 
| Detector | Proportional counters(PC)or scintillation counter(SC),Silicon dtift detector(SDD),High speed one-dimensional semiconductor array detector | 
| Maximal counting rate of linearity | 5×105CPS(PC、SC with the compensate function of miss counting)、15×104CPS (SDD)、9×107CPS(one-dimensional array) | 
| Energy resolution ratio | ≤25%(PC、one-dimensional array)、≤50%(SC)、≤200eV(SDD) | 
| Counting fashion | differential coefficient or integral, PHA automatically, dead time regulate | 
| Stability of system measure | ≤0.01% | 
| Scattered rays dose | ≤1μSv/h(without X-ray protective device) | 
| Instrument integrative stability | ≤0.5% | 
| Figure size | 1000×800×1600mm | 
										
| Registration Date | 2016/12/28(Year/Month/Date) | 
|---|---|
| Buyer / Seller in EC21 | Seller | 
| Business Type | Manufacturer | 
| Year established | 2003 | 
| Employees total | 101 - 500 | 
| Annual revenue | USD 100,000 - 500,000 | 
| Company | Dandong Aolong Radiative Instrument Group Co., Ltd | 
|---|---|
| Address | No.66 Aihe Street, Zhenxing DistrictDandongLiaoning118009China | 
| Phone | 86 - 0415 - 3458127 | 
| Homepage | http://aolonggroup.cn/ | 
| Contact | Diana |