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3D Optical Surface Profilometer SuperView W1

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3D Optical Surface Profilometer SuperView W1
filter for full field of view*3 Measure Sa 0.2nm silicon wafer in a laboratory environment according to the ISO 25178.*4 Measure standard 4.7μm steps height block in a laboratory environment ...

Flash Measuring Machine VX8100

This company has a company video.
Flash Measuring Machine VX8100
filter conditions for history extraction. StratisticsThe trend graph displays the regular trend of the measured values, such as the monotonic and periodic change of the measured values, which can be ...
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