3D Optical Surface Profilometer SuperView W1

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Supplier Info.

Company Name CHOTEST Technology Inc.
Membership Free member
Registration Date2024.06.13
Country/RegionChina
CityShenzhen
Contact Omiga(Mr.)

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Product Attributes

- Brand Name CHOTEST
- Model Number SuperView W1
- Place of Origin China
- Supply Type In-Stock Items
- Condition New
- Color White
- Related Keywords rough roughness profilome, surface roughness profilo, high precision surface ro

Description by Manufacturer

Model No.: SuperView W1/W1-Pro
Product name: Nano 3D Optical Surface Profilometers
Standard field of view: (0.98*0.98)mm
Max field of view: (6x6)mm
Reflectivity of test object: 0.5 % ~100 %
Repeatability of Roughness RMS: 0.005nm
Scanning range: ≤10mm Resolution: 0.1nm
Accuracy of stage measurement: 0.3 %
Repeatability of stage measurement: 0.08% 1σ

Description

SuperView W1 Optical 3D Surface profilometer is an ideal instrument for sub-Nanometer measurement of various precision parts. Based on the principle of white light interference technology, combined with precision Z-direction scanning module and 3D modeling algorithm, it contactlessly scans the surface of the object then establish a 3D image for the surface. A serial of 2D, 3D parameters reflecting surface quality of the object are obtained after XtremeVision software processes and analyzes the 3D image. The SuperView W1 is a user-friendly precision optical instrument with powerful analysis functions for all kinds of surface form & roughness parameters. With unique light source it could measure various precision parts with both smooth and rough surface.

Parameters

Model No.		SuperView W1	SuperView W1-Pro
Light source		White LED
Video system		1024×1024
Standard Field of View		0.98×0.98 mm
Max Field of View		6.0×6.0 mm(Optional)
Lens Turret		Manual 3 holes turret(Optional: Motaorized 5 holes turret)
XY Object table	Size	320×200mm	300×300mm
	Moving range	140×100mm	200×200mm
	Loading capacity	10kg
	Control method	Motorized
Tilt		±5°
Z Axis	Tracvel range	100mm
	Control method	Motorized
Z Stroke Scanning range		10mm
Surface Form Repeaability*²		0.1nm
Roughness RMS Repeatability*³		0.005nm
Step Hiehgt Measurementy*⁴		Accuracy: 0.3% Repeatability: 0.008%(1σ)
Scanning Speed at 0.1nm resulution		1.85μm/s
Reflectivity of Test Object		0.05%~100%
Size(LWH)		700x606x920mm
Weight		<160kg
Operating Environment	Temperature	15°C~30°C, fuctuation <1°C/15min
	Humidity	5%~95% RH, no condensation
	Vibration	VC-C or better
	Software Noise Evaluation*⁵	3σ≤4nm
	Compressed Air	0.6Mpa oil-free, water-free, 6mm diameter of hose
	Power Supply	AC100~240V, 50/60Hz, 4A, 300W
	Other	No strong magnetic field, No corrosive gas
1 W1 is the standard model of 3D Optical Surface Profilometer; W1-pro has larger stage size and travel range. W1-Ultra has greatly improved the scanning speed compared to W1. 2 Use EPSl mode to measure Sa 0.2nm silicon wafer in the laboratory environment; Single stripe, 80um filter for full field of view 3 Measure Sa 0.2nm silicon wafer in a laboratory environment according to the ISO 25178. 4 Measure standard 4.7μm steps height block in a laboratory environment according to the ISO 5436-1:2000 *5 When the software noise evaluation is 4nm≤3σ≤10nm, the Roughness RMS repeatability is revised down to 0.015nm, the Step height measurement accuracy is revised down to 0.7%, and the step height measurement repeatability is revised down to 0.12%; When the software noise evaluation is 3σ>10nm, the environment does not meet the requirement for usage of the equipment, and need to change the site.

Remark: Performance parameters are tested by using a 4.7µm precision master stage gauge in lab according to ISO 4287 and ISO 25178.

Zoom ratio of lens			2.5×	5×	10×	20×	50×	100×
Numerical hole diameter			0.075	0.13	0.3	0.4	0.55	0.7
Optical resolution at 550nm (µm )			3.7	2.1	0.92	0.69	0.5	0.4
Depth of focus( µm)			48.6	16.2	3.04	1.71	0.9	0.56
Working distance( mm)			10.3	9.3	7.4	4.7	3.4	2.0
Field H ×V (mm)	Video system 1024×1024	0.5×	3.92× 3.92	1.96×1.96	0.98×0.98	0.49×0.49	0.196×0.196	0.098×0.0 98
		0.75×	2.6× 2.6	1.3×1.3	0.65×0.65	0.325×0.325	0.13×0.13	0.065×0.065
		1×	1.96× 1.96	0.98×0.98	0.49×0.49	0.245×0.245	0.098×0.098	0.049 ×0.049

※ Built-in ISO/ASME/EUR/GBT Standards of 2D, 3D parameters:

2D Parameters

Standard	Parameters
ISO 4287-1997		Principal section	Roughness	Waviness
	Amplitude	Pp, Pv ,Pz, Pc, Pt,Pa,Pq,Psk,Pku	Rp, Rv ,Rz, Rc, Rt,Ra,Rq,Rsk,Rku	Wp, Wv ,Wz, Wc, Wt,Wa,Wq,Wsk,Wku
	interval	PSm,Pdq	RSm,Rdq	WSm,Wdq
	Substance	Pmr,Pdc	Rmr,Rdc,Rmr(Rz/4)	Wmr,Wdc,Wmr(Wz/4)
	Peak	PPc	RPc	WPc
ISO 13565	ISO 13565-2	Rk,Rpk,Rvk,Mr1,Mr2,A1,A2,Rpk,Rvk
ISO 12085	Roughness graph	R,AR,R× ,Nr
	Waviness graph	W,AW,W×,Wte
	Other graph	Rke,Rpke,Rvke
AMSE B46.1	2D	Rt,Rp,Rv,Rz,Rpm,Rma×,Ra,Rq,Rsk,Rku,tp,Htp,Pc,Rda,Rdq,RSm,Wt
DIN EN ISO 4287-2010	Original profile	Pa,Pq,Pp,Pv,Pz,Pc,Pt,PSk,PKu,PSm,PPc,Pdq,Pdc,Pmr,
	Roughness	Ra,Rq,Rp,Rv,Rz,Rc,Rt,RSk,RKu,RSm,RPc,Rdq,Rdc,Rmr,
	Waviness	Wa,Wq,Wp,Wv,Wz,Wc,Wt,WSk,WKu,WSm,WPc,Wdq,Wdc,Wmr
JIS B0601-2013	Original profile	Pa,Pq,Pp,Pv,Pz,Pc,Pt,PSk,PKu,PSm,PPc,Pdq,Pdc,Pmr,
	Roughness	Ra,Rq,Rp,Rv,Rz,Rc,Rt,RSk,RKu,RSm,Rdq,Rdc,Rmr
	Waviness	Wa,Wq,Wp,Wv,Wz,Wc,Wt,WSk,WKu,WSm,WPc,Wdq,Wdc,Wmr
GBT 3505-2009	Original profile	Pa,Pq,Pp,Pv,Pz,Pc,Pt,PSk,PKu,PSm,PPc,Pdq,Pdc,Pmr,
	Roughness	Ra,Rq,Rp,Rv,Rz,Rc,Rt,RSk,RKu,RSm,Rdq,Rdc,Rmr
	Waviness	Wa,Wq,Wp,Wv,Wz,Wc,Wt,WSk,WKu,WSm,WPc,Wdq,Wdc,Wmr

3D Parameters

Standard	Parameters
ISO 25178	Height	Sq,Ssk,Sku,Sp,Sv,Sz,Sa
	function	Smr,Smc,S×p
	Space	Sal,Str,Std
	Composite parameters	Sdq,Sdr
	Volume	Vm,Vv,Vmp,Vmc,Vvc,Vvv
	Form	Spd,Spc,S10z,S5p,S5v,Sda,Sha,Sdv,Shv
	Functional	Sk,Spk,Svk,Smr1,Smr2,Spq,Svq,Smq
ISO 12781	Flatness	FLTt,FLTp,FLTv,FLTq
EUR 15178N	Amplitude	Sa,Sq,Sz,Ssk,Sku,Sp,Sv,St
	Space	Str,Std,Sal
	Composite parameters	Sdq,Sds,Ssc,Sdr,Sfd
	Area, Volume	Smr,Sdc
	Function	Sk,Spk,Svk,Sr1,Sr2,Spq,Svq,Smq
	Functional	Sbi,Sci,Svi
EUR 16145 EN	Amplitude	Sa,Sq,Sy,Sz,Ssk,Sku
	Mixed parameters	Ssc,Sdq,Sdr
	Functional	Sbi,Sci,Svi,Sk,Spk,Svk
	Space	Sds,Std,Stdi,Srw,Srwi
	Hardness	Hs,Hvol,Hv,Hps,Hpvol,Hpv,Hap,Hbp
ASME B46.1	3D	St,Sp,Sv,Sq,Sa,Ssk,Sku,SWt

Applications

It is used for measurement and analysis of surface roughness and profile of precision components from industries of semi-conductor, 3C Electronics, ultraprecise machining, optical machining, micro-nano materials, micro-electro-mechanical system.

Measurement and analysis for various products, components and materials`surface form and profile characteristics, such as flatness, roughness, waviness, appearance, surface defect, abrasion,corrosion, gap, hole, stage, curvature, deformation, etc.

3C Electronics_Sapphire crystal

3C Electronics _ Ink screen

Price

Price US$ 1 ~ 10 / Unit

Packaging & Shipping

- Delivery Lead Time30
- Minimum Order 1 Unit
- Supply Ability30
- Total quantity in Stock21 – 50
- Shipping Career

Product Image

3D Optical Surface Profilometer SuperView W1

Product Video

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Main Export Markets

- CHOTEST Technology Inc. is mainly exporting to China (Mainland), Asia, Europe, North America, South America, Australia, Africa

Download Product Brochure

2.pdf (8.05 Mb)

Company Profile

About CHOTEST Technology Inc.

Membership Free member
Registration Date2024.06.13
Country/RegionChina
CityShenzhen
Contact Omiga(Mr.)

CHOTEST is a national high-tech enterprise integrating research, development, production and sales. Committed to the design and production of precision measuring instruments and calibration instruments.
Since the company established, we insist on technological innovation as the basis of development. With more than15 years of development, our company has accumulated rich practical experience and established a strong professional technical team in optics, mechanics, electronics and information technology, also owns a number of technology patents and software intellectual property rights. We have unique designing and manufacturing advantages in Micro-Nano motion, 3D Reconstruction of Micro-Nano measurement, 3D Form and Surface Analysis of Micro-Nano measurement, Large-scale 3D Measurement, Precision Sensing Probe, Control & of Glass-Scale and Guide Rail etc. That is why we have ability to provide our customers with professional precision measurement solution from nano meter to hundred meter.
At present there are over 300 employees in our company, we got modern office in Nanshan, Shenzhen and precision machining & assembly factory in Baoan, Shenzhen. In addition, we also built a number of professional laboratories with advanced research facilities. All products are manufactured in accordance with ISO9001, 6S standard and always provide customers with top quality products.
The sales network and service outlets of our company have covered more than 30 provinces in China, in the meanwhile our overseas market is also growing fast.
With more than 15 years of professional technology accumulation, we designed and manufactured White Light Interferometer SuperView W1, Laser Tracker GT series, Universal Thread Measuring Machines SJ5200 series, Universal Length Measuring Machines SJ5100 series, Laser Interferometer SJ6000, Profilometers SJ5700 series, Automated Dial Indicator Testing Machines SJ2000 series and other high-end measuring

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Selling Categories

- Measurement & Analysis Instruments >> Physical Measuring Instruments
- Measurement & Analysis Instruments >> Testing Equipment

Keywords

Video Measuring Machines , Flash measuring machines , Profilometer , Universal Length Measuring Machines

Registration Date	2024/06/13(Year/Month/Date)
Buyer / Seller in EC21	Seller
Business Type	Manufacturer
Year established	2005
Employees total	501 - 1000
Annual revenue	USD 500,001 - 1,000,000

Contact Information Order Credit Report

Company	CHOTEST Technology Inc.
Address	2/F, Building B1, Zhiyuan, Xueyuan Road, Xili, Nanshan, Shenzhen 518071, ChinaShenzhenGuangdong518000China
Phone	86 - 83318988 - 227
Homepage	en.chotest.com
Contact	Omiga

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3D Optical Surface Profilometer SuperView W1

Product Attributes

Description by Manufacturer

Description

Parameters

Applications

Price

Packaging & Shipping

Product Image

Product Video

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Main Export Markets

Download Product Brochure

Company Profile

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