Dual-ended Test Probe & POGO PIN
The double headed test probe, also known as a double ended probe, is an electrical testing tool with a contact point on both ends, used to make simultaneous electrical connections. It features two probes, often a top and a bottom compliant plunger, that can be used for testing both sides of a device or for making shorter signal paths between a tester and the device under test (DUT).
Product Introduction:
The probe has an outer diameter of 0.58mm and a total length of 5.7mm. Both ends of the probe are claw-shaped or pointed.
Key features and uses
1.Double sided testing: Allows for simultaneous probing of a device from both the top and bottom, which is crucial for testing complex components like semiconductor wafers.
2.Improved signal integrity: By using a double sided system to make direct contact with a device, the inductance from the test chuck can be removed, leading to more accurate results.
3.Shorter signal paths: In applications like testing fixtures, double ended sockets can be used to create much shorter signal paths compared to conventional wiring, improving signal quality.
Specifications :
Custom sizes are available upon request.
Product Advantages:
Stable sampling, stable overload performance, and low false positive rate.
Main Applications:
IC testing in BGA, micro BGA, CSP sockets.
Main Application Industries:
Mobile phones, computers, communications, etc. Almost every industry that uses chips has adopted semiconductor test probes for testing, with the chip packaging testing industry having the largest demand.
