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  5. linear array linear array
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  • X-ray Titanium Dioxide Analyzing Diffraction Instrument

    • Place of origin:  

      China

    linearity International standard sample(Si, Al203), the angle of all peak in full spectrum are not more than ±0.02° Detector Proportional counters(PC)or scintillation counter(SC),Silicon dtift detector(SDD),High speed one-dimensional semiconductor array detector Maximal counting rate of linearity 5×105CPS(PC､SC with the compensate function of miss counting)､15×104CPS (S

    [Related Keywords : XRD, X-ray Diffractometer]

    Contact Now Start Order

  • Industrial X-ray Diffractometer Meter

    • Place of origin:  

      China

    linearity International standard sample(Si, Al203), the angle of all peak in full spectrum are not more than ±0.02° Detector Proportional counters(PC)or scintillation counter(SC),Silicon dtift detector(SDD),High speed one-dimensional semiconductor array detector Maximal counting rate of linearity 5×105CPS(PC､SC with the compensate function of miss counting)､15×104CPS (S

    [Related Keywords : XRD, Diffractometer]

    Contact Now Start Order

  • Multifunctional Industrial X-ray Diffractometer

    • Place of origin:  

      China

    linearity International standard sample(Si, Al203), the angle of all peak in full spectrum are not more than ±0.02° Detector Proportional counters(PC)or scintillation counter(SC),Silicon dtift detector(SDD),High speed one-dimensional semiconductor array detector Maximal counting rate of linearity 5×105CPS(PC､SC with the compensate function of miss counting)､15×104CPS (S

    [Related Keywords : XRD, Diffractometer]

    Contact Now Start Order

  • Multifunctional XRD Instrument

    • Place of origin:  

      China

    linearity International standard sample(Si, Al203), the angle of all peak in full spectrum are not more than ±0.02° Detector Proportional counters(PC)or scintillation counter(SC),Silicon dtift detector(SDD),High speed one-dimensional semiconductor array detector Maximal counting rate of linearity 5×105CPS(PC､SC with the compensate function of miss counting)､15×104CPS (S

    [Related Keywords : XRD, X-ray Diffractometer]

    Contact Now Start Order

  • Multi-functional X-ray Diffractometer

    • Place of origin:  

      China

    linearity International standard sample(Si, Al203), the angle of all peak in full spectrum are not more than ±0.02° Detector Proportional counters(PC)or scintillation counter(SC),Silicon dtift detector(SDD),High speed one-dimensional semiconductor array detector Maximal counting rate of linearity 5×105CPS(PC､SC with the compensate function of miss counting)､15×104CPS (S

    [Related Keywords : X-ray Diffractometer, XRD]

    Contact Now Start Order

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