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Place of origin:
China
phase identification of unknown sample * Quantitative analysis of the phase in the mixed sample * Crystal structure analysis ( Rietveld structure analysis) * The crystal structure change (high temperature and low temperature condition) of the abnormal condition. * Thin film sample analysis, including film, multilayer film thickness, surface roughness, charge density. * Analysis of micro area
[Related Keywords : XRD, X-ray Diffractometer]
Business Type
Manufacturer
Location
Liaoning, China
Employees Total
101 - 500
Annual Revenue
USD 100,000 - 500,000
Place of origin:
China
phase identification of unknown sample * Quantitative analysis of the phase in the mixed sample * Crystal structure analysis ( Rietveld structure analysis) * The crystal structure change (high temperature and low temperature condition) of the abnormal condition. * Thin film sample analysis, including film, multilayer film thickness, surface roughness, charge density. * Analysis of micro area
[Related Keywords : XRD, Diffractometer]
Business Type
Manufacturer
Location
Liaoning, China
Employees Total
101 - 500
Annual Revenue
USD 100,000 - 500,000
Place of origin:
China
phase identification of unknown sample * Quantitative analysis of the phase in the mixed sample * Crystal structure analysis ( Rietveld structure analysis) * The crystal structure change (high temperature and low temperature condition) of the abnormal condition. * Thin film sample analysis, including film, multilayer film thickness, surface roughness, charge density. * Analysis of micro area
[Related Keywords : XRD, Diffractometer]
Business Type
Manufacturer
Location
Liaoning, China
Employees Total
101 - 500
Annual Revenue
USD 100,000 - 500,000
Place of origin:
China
phase identification of unknown sample * Quantitative analysis of the phase in the mixed sample * Crystal structure analysis ( Rietveld structure analysis) * The crystal structure change (high temperature and low temperature condition) of the abnormal condition. * Thin film sample analysis, including film, multilayer film thickness, surface roughness, charge density. * Analysis of micro area
[Related Keywords : XRD, X-ray Diffractometer]
Business Type
Manufacturer
Location
Liaoning, China
Employees Total
101 - 500
Annual Revenue
USD 100,000 - 500,000
Place of origin:
China
phase identification of unknown sample * Quantitative analysis of the phase in the mixed sample * Crystal structure analysis ( Rietveld structure analysis) * The crystal structure change (high temperature and low temperature condition) of the abnormal condition. * Thin film sample analysis, including film, multilayer film thickness, surface roughness, charge density. * Analysis of micro area
[Related Keywords : X-ray Diffractometer, XRD]
Business Type
Manufacturer
Location
Liaoning, China
Employees Total
101 - 500
Annual Revenue
USD 100,000 - 500,000
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