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  1. China (9)
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  • VT6100 Confocal Microscope

    • Min. Order:  

      1 Unit

    • Price:  

      US$ 9999~19999

    • Place of origin:  

      China

    counted, realizing the function of rapid batch measurement 2) The visualization window is convenient for users to observe the scanning process in real time 3) Combined with the automatic measurement function of the custom analysis template, the multi-region measurement and analysis can be automatically completed 4) Five functional modules of geometric analysis, roughness analysis, structural anal

    [Related Keywords : Confocal Microscope, micro-nano level measurem, surface roughness]

    • CHOTEST Technology Inc.
    • Business Type

      Manufacturer

    • Location

      Guangdong, China

    • Employees Total

      501 - 1000

    • Annual Revenue

      USD 500,001 - 1,000,000

  • Trimble C5 Mechanical Total Station

    • Place of origin:  

      United States

    Trimble C5 Mechanical Total Station DESCRIPTION Trimble C5 is lightweight and compact, which eases storage, transportation, and configuration. It’s designed to deliver outstanding results; count on her to do at the highest level, at the highest levels. The total station C5 standard features two-color touchscreens for the first and second position performance, autofocus, strong non-reflector ran

    [Related Keywords : Total Station, Surveying Equipment, Surveying Instrument, Analysis Equipment]

    • Hericsurveying
    • Business Type

      Supplier

    • Location

      Singapore, Singapore

    • Employees Total

      51 - 100

    • Annual Revenue

      USD 2,000,001 - 5,000,000

  • Trimble S5 36 Hours Reflectorless Fastest Measurement Time Total Station

    • Min. Order:  

      1 Set

    • Price:  

      US$ 6300

    • Place of origin:  

      China

    count)0.1" (0.01 mgon)Automatic level compensator TypeCentered dual-axisAccuracy0.5" (0.15 mgon)Range±5.4' (±100 mgon)Distance measurementAccuracy (RMSE) Prism mode Standard11 mm + 2 ppm (0.003 ft + 2 ppm)Tracking4mm + 2 ppm (0.013 ft + 2 ppm)DR mode Standard2mm + 2 ppm (0.0065 ft + 2 ppm)Tracking4mm + 2 ppm (0.013 ft + 2 ppm)Extended Range10mm + 2 ppm (0.033 ft + 2 ppm)Measuring timeStandard1.

    [Related Keywords : Optical Instruments]

    • China Wonder Survey Co.,Ltd
    • Business Type

      Supplier

    • Location

      Shanghai, China

    • Employees Total

      51 - 100

    • Annual Revenue

      USD 10,000,001 - 50,000,000

  • X-ray Titanium Dioxide Analyzing Diffraction Instrument

    • Place of origin:  

      China

    stepping and Omg Minimal stepping angle 1/10000° Angle repeatable accuracy 1/10000° 2θ Angular linearity International standard sample(Si, Al203), the angle of all peak in full spectrum are not more than ±0.02° Detector Proportional counters(PC)or scintillation counter(SC),Silicon dtift detector(SDD),High speed one-dimensional semiconductor array detector Maximal counting

    [Related Keywords : XRD, X-ray Diffractometer]

  • Industrial X-ray Diffractometer Meter

    • Place of origin:  

      China

    stepping and Omg Minimal stepping angle 1/10000° Angle repeatable accuracy 1/10000° 2θ Angular linearity International standard sample(Si, Al203), the angle of all peak in full spectrum are not more than ±0.02° Detector Proportional counters(PC)or scintillation counter(SC),Silicon dtift detector(SDD),High speed one-dimensional semiconductor array detector Maximal counting

    [Related Keywords : XRD, Diffractometer]

  • Multifunctional Industrial X-ray Diffractometer

    • Place of origin:  

      China

    stepping and Omg Minimal stepping angle 1/10000° Angle repeatable accuracy 1/10000° 2θ Angular linearity International standard sample(Si, Al203), the angle of all peak in full spectrum are not more than ±0.02° Detector Proportional counters(PC)or scintillation counter(SC),Silicon dtift detector(SDD),High speed one-dimensional semiconductor array detector Maximal counting

    [Related Keywords : XRD, Diffractometer]

  • Multifunctional XRD Instrument

    • Place of origin:  

      China

    stepping and Omg Minimal stepping angle 1/10000° Angle repeatable accuracy 1/10000° 2θ Angular linearity International standard sample(Si, Al203), the angle of all peak in full spectrum are not more than ±0.02° Detector Proportional counters(PC)or scintillation counter(SC),Silicon dtift detector(SDD),High speed one-dimensional semiconductor array detector Maximal counting

    [Related Keywords : XRD, X-ray Diffractometer]

  • Multi-functional X-ray Diffractometer

    • Place of origin:  

      China

    stepping and Omg Minimal stepping angle 1/10000° Angle repeatable accuracy 1/10000° 2θ Angular linearity International standard sample(Si, Al203), the angle of all peak in full spectrum are not more than ±0.02° Detector Proportional counters(PC)or scintillation counter(SC),Silicon dtift detector(SDD),High speed one-dimensional semiconductor array detector Maximal counting

    [Related Keywords : X-ray Diffractometer, XRD]

  • Industrial Desktop X-ray Diffractometer

    • Place of origin:  

      China

    stepping and Omg Angle scanning range: θs / θd dlinkage /single action: -3° -150° Minimal stepping wide: 0.0001° Angle repeatable accuracy: 0.0005° Angle locating speed: 1500°/min Counter: Closed proportional counters or High speed one-dimensional semiconductor counter Maximal counting rate of linearity: ≥ 5 × 105CPS (Proportional), ≤9×107CP

    [Related Keywords : XRD, Desktop Diffractometer]

  • Desktop X-ray Diffractometer

    • Place of origin:  

      China

    stepping and Omg Angle scanning range: θs / θd dlinkage /single action: -3° -150° Minimal stepping wide: 0.0001° Angle repeatable accuracy: 0.0005° Angle locating speed: 1500°/min Counter: Closed proportional counters or High speed one-dimensional semiconductor counter Maximal counting rate of linearity: ≥ 5 × 105CPS (Proportional), ≤9×107CP

    [Related Keywords : XRD, Diffractometer]

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