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  1. China (14)
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  • Industrial X-ray Diffractometer Meter

    • Place of origin:  

      China

    identification of unknown sample * Quantitative analysis of the phase in the mixed sample * Crystal structure analysis ( Rietveld structure analysis) * The crystal structure change (high temperature and low temperature condition) of the abnormal condition. * Thin film sample analysis, including film, multilayer film thickness, surface roughness, charge density. * Analysis of micro area sampl

    [Related Keywords : XRD, Diffractometer]

  • Multifunctional Industrial X-ray Diffractometer

    • Place of origin:  

      China

    identification of unknown sample * Quantitative analysis of the phase in the mixed sample * Crystal structure analysis ( Rietveld structure analysis) * The crystal structure change (high temperature and low temperature condition) of the abnormal condition. * Thin film sample analysis, including film, multilayer film thickness, surface roughness, charge density. * Analysis of micro area sampl

    [Related Keywords : XRD, Diffractometer]

  • Multifunctional XRD Instrument

    • Place of origin:  

      China

    identification of unknown sample * Quantitative analysis of the phase in the mixed sample * Crystal structure analysis ( Rietveld structure analysis) * The crystal structure change (high temperature and low temperature condition) of the abnormal condition. * Thin film sample analysis, including film, multilayer film thickness, surface roughness, charge density. * Analysis of micro area sampl

    [Related Keywords : XRD, X-ray Diffractometer]

  • Multi-functional X-ray Diffractometer

    • Place of origin:  

      China

    identification of unknown sample * Quantitative analysis of the phase in the mixed sample * Crystal structure analysis ( Rietveld structure analysis) * The crystal structure change (high temperature and low temperature condition) of the abnormal condition. * Thin film sample analysis, including film, multilayer film thickness, surface roughness, charge density. * Analysis of micro area sampl

    [Related Keywords : X-ray Diffractometer, XRD]

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